Dr. Antonio “Tony” Caputo, Reliability Scientist at the Chandler Analytical Services Lab, has become a member of the IPC CAF committee. This task group is responsible for determining the causes of electrochemical migration (ECM) activity within printed circuit boards. He will also participate in the IPC’s 5-32b SIR and Electrochemical Migration Task Group, which will explore Conductive Anodic Filament (CAF) growth and other ECM failure mechanisms within the boards.
Tony joined Isola in July 2014 and is responsible for investigating CAF issues to determine process and manufacturing improvements to provide enhanced CAF performance. Tony has spent more than 10 years working on electrochemical corrosion failure modes and researching the importance of CAF. He has worked in collaboration with the Center for Microelectronics, Assembly, and Packaging (CMAP), BlackBerry, and other world experts working on CAF. Tony has authored several publications and book chapters related to the importance of PCB hole drilling and the chemical nature of CAF.
Tony obtained degrees in chemistry and engineering as well as a Ph.D. from the University of Toronto. Upon completion of his doctorate, Tony was a postdoctoral associate at the Massachusetts Institute of Technology (MIT). His postdoctoral work led to several publications, patents, and conference presentations in the field of energy storage. Tony remains a research affiliate at MIT.