A FREE Event brought to you by Isola, Anritsu and Simberian...
Signal Integrity Symposium:
Easing the Transition to Higher Speed Designs
Wednesday, November 19, 2014
9:30 AM to 4:15 PM (Lunch is included)
Crowne Plaza San Marcos Golf Resort
One San Marcos Place
Chandler, AZ 85225
As data rates increase, PCB design becomes more challenging. Without a disciplined design process, there is significant risk of multiple design iterations that can cause schedule delays and ultimately affect performance goals. At high data rates, RF effects become pronounced, so the design process must incorporate S-parameter analysis.
This symposium will walk through processes from concept to validation, as demonstrated by experts in the design process, design simulation, measurement and dielectric materials. Live VNA and BERT demonstrations are incorporated into this complimentary event.
At the conclusion of the symposium, individual device under test (DUT) measurements will be offered on Anritsu’s MS4640B VectorStar VNA or MP1800A BERT. We encourage you to bring any hardware or devices that you might be working on for a free evaluation.
Who should attend:
Engineers and Engineering Managers active in high-speed design.
This symposium is a must if you are:
- Transitioning or planning to transition to higher bit rates up to 28 Gb/s or higher
- Simulating high bit rate channels
- Exploring tools and methods to help measurements match simulations and get higher quality measurement results
- Looking for ways to overcome signal integrity challenges induced by microscale PCB effects
- Interested in increasing high speed design confidence, reducing risk and improving schedule conformance
9:00 AM On-site registration opens
9:30 AM Morning Sessions Commence
11:45 AM Lunch
12:45 PM Afternoon Sessions Commence
4:15 PM Symposium Concludes
- The Case for VNAs & S-parameters: Measuring for Max Performance
- S-parameter Quality Metrics & Analysis to Measurements Correlation
- Engineering Dielectrics to Overcome Signal Integrity Challenges
- Conducting Accurate High-Speed BER Tests